Part 1 -- Boundary-Scan Introduction
IEEE 1149.1 Standard
BSDL file
Chip for Boundary-Scan Architecture
TAP controller
Boundary-Scan test
What can be test byBoundary-Scan
Part 2 -- DFT(Design for test)
Part 3 -- ScanExpress module introduction
TPG
Runner
Part 4 -- Example exercise--Training Class Lab Exercises
1-7
Exercise 1 – Understanding the ScanPlus Demo Board
Exercise 2 – ScanExpressTPG: Test Preparation
Exercise 3 – ScanExpressTPG: Test Generation
Exercise 4 – ScanExpressDFT Analyzer: Partial Coverage
Exercise 5 – ScanExpressDFT Analyzer: Moderate Coverage
Exercise 6 – ScanExpressDFT Analyzer: Complete Coverage
Exercise 7 – ScanExpress Runner: Test Execution
Exercise 8 – ScanExpress Viewer: Fault Visualizer
Exercise 9 – ScanExpressTPG: Cluster Test Generation
Exercise 10 – ScanExpress Runner: Flash FPI Files
Exercise 11 – ScanExpress Runner: Programming Files
Exercise 12 – ScanExpress Debugger: Manual Diagnostics
Exercise 12a – ScanExpress Debugger: More Diagnostics
Exercise 13 – ScanExpressTPG: More Cluster Testing
Exercise 14 – ScanExpressTPG: More Cluster Testing
Exercise 15 – ScanExpressTPG: Flash Optimization
Exercise 15a – ScanExpress Programmer: Fastest Program
Exercise 16 – ScanExpressTPG: Scripts
Exercise 17a – ScanExpress TPG: More Script Testing
Quiz
